LECTURE
- Field Effect Transistors
6. Field Effect Transistors
- Junctions
5. Junctions
- Excess Carriers in Semiconductors
4. Excess Carriers in Semiconductors
PUBLICATIONS
- H.J.Kim, J.H.Choi, S.E.Lee, S.W.Kim, H.C.Lee; Fabrication and Characterization of Ferroelectric Capacitors with a Symmetric Hybrid TiN/W/HZO/W/TiN Electrode Structure, Materials. 18 (2025) 3547
- H.J.Kim, J.H.Choi, S.E.Lee, S.W.Kim, H.C.Lee; Fabrication and Characterization of Ferroelectric Capacitors with a Symmetric Hybrid TiN/W/HZO/W/TiN Electrode Structure, Materials. 18 (2025) 3547
- M.S.Jo, S.W.Kim, S.E.Lee, H.C.Lee; Enhancement of critical current density in large?grained Li6.5La3Zr1.5Ta0.5O12 solid electrolyte ceramics by γ?Al2O3 additives, J. Kor. Ceram. Soc., 62 (2025) 281
- M.S.Jo, S.W.Kim, S.E.Lee, H.C.Lee; Enhancement of critical current density in large-grained Li6.5La3Zr1.5Ta0.5O12 solid electrolyte ceramics by y-Al2O3 additives, J. Kor. Ceram. Soc., 62 (2025) 281
- W.J.Park, H.J.Kim, J.H.Lee, J.H.Kim, J.H.Kim, S.H.Uhm, S.W.Kim, H.C.Lee; Characterization of HZO Films Fabricated by Co-Plasma Atomic Layer Deposition for Ferroelectric Memory Applications, Nanomaterials. 14(2024) 1801
- W.J.Park, H.J.Kim, J.H.Lee, J.H.Kim, J.H.Kim, S.H.Uhm, S.W.Kim, H.C.Lee; Characterization of HZO Films Fabricated by Co-Plasma Atomic Layer Deposition for Ferroelectric Memory Applications, Nanomaterials. 14 (2024) 1801
- ABOUT LAB
- 반도체 플라즈마공정 연구실 (Semicon Plasma Process LAB)를 소개합니다.
- PROFESSOR
- 반도체 플라즈마공정 연구실 (Semicon Plasma Process LAB)의 교수님을 소개합니다.
- RESEARCH
- 반도체 플라즈마공정 연구실 (Semicon Plasma Process LAB)의 연구내용을 소개합니다.
- MEMBER
- 반도체 플라즈마공정 연구실 (Semicon Plasma Process LAB)의 구성원을 소개합니다.
